SESHA 2003 Symposium - PDC Description

Life Cycle Risk Management of Engineered and Personnel Systems

Taylor, Kiley; Trammell, Steve; Davis, Brett
(Motorola, Austin and Zephyr Environmental, Austin)

As utility and support systems for semiconductor manufacturing have become more complex and potentially hazardous, risk management of systems failures or interruptions that result in adverse effects to human health, the environment or production has become increasingly important. This course will provide an overview of risk management models applicable to the life cycles of engineered. Course participants will learn to apply a risk assessment technique, methods to identify superior failure detection and prevention controls, and an incident root cause identification and elimination technique. Using the tools debuted in this course will enable the attendee to control risk during a system’s design, operations, modifications and closure phases. Course attendees will learn a hybridized hazard operability (HazOp) study and failure modes and effects analysis (FMEA) methodology. This tool was specifically developed for design review for continuous, instantaneous delivery semiconductor manufacturing utility and support processes, such as ultrapure water treatment, electrical power distribution, and waste collection and treatment systems. Course attendees will learn how to properly characterize operational controls and determine their relative effectiveness. Course attendees will examine a root cause analysis system, which is used to identify “correctable opportunities” of undesired events consistently and accurately. This technique is a critical thinking skill that utilizes incident investigation results to build event models for diagnosis of the system failure.

[description as .pdf]