SESHA 2010 Symposium - Abstract

Approach to LEED EB: O&M Certification for Intel’s Fab 32 Ocotillo Campus

Jennifer Aiston, Taimur Burki; Frist, Bernie; Wilhelm, Mark
(Intel, ARCADIS, Green Ideas)

LEED-EB O&M was originally conceived for office building environments. As a result it can be difficult to apply LEED-EB O&M to manufacturing due to energy intensity and a greater range of environmental and operational concerns. However, it is important to find ways to apply LEED to existing manufacturing facilities since they consume 25% of energy in the U.S. (U.S. Energy Information Administration, September 2009). This session provides an introduction to LEED EB: O&M and includes a panel discussion regarding the certification process and lessons learned while pursuing LEED-EB: O&M certification for the Intel Arizona’s Fab 32 Ocotillo Campus – one of the most complicated manufacturing operations in the world. An overview of the campus approach to LEED-EB: O&M, will be followed by a dialogue with the project consulting team and key project stakeholders. This team is responsible for driving Intel's sustainability efforts in buildings and operations through the implementation of a Green Building Policy. The goal of this session is to educate the audience on the challenges faced, and opportunities identified, while pursuing LEED-EB: O&M certification of an existing high-volume semiconductor manufacturing site.