Twin Cities Chapter

Date: June 23, 2000

Topic: SESHA Conference / Chapter Initiatives

Host: Aon Risk Services

Summary of Meeting:

The Twin Cities Chapter met on Tuesday, June 13th at Aon Risk Services in Bloomington, MN. The purpose was to review SESHA Conference activities and to discuss Twin Cities Chapter initiatives for 2001. Brian Finder, Assistant Professor in Risk Control at the University of Wisconsin-Stout, also attended the meeting to discuss the SESHA student chapter, the annual semiconductor mini-conference, and the opportunity of working more closely with the Twin Cities Chapter membership. Mike Sherman, FSI Product Safety, shared with the group a number of issues he was working on – ventilation maximization studies, fire codes, arsine TLV, heated chemical issues, ergonomics, tracer gas for spill evaporation studies, and risk assessment methods for quantifying probabilities. Six members attended the meeting representing FSI, Honeywell, Cypress, Aon and UW-Stout.

The meeting proceeded as follows:

Reviewed March Meeting Minutes
-MnOSHA presentation

-Patricia Zonvar – Matheson Tri-Gas (SAGETM Phosphine)

SESHA Conference Review
-Program Handout (articles available for downloading)

-Genesis Award

-SESHA Chapter Leadership Meeting review

TC Chapter Initiatives
-Chapter Organization.

*Chapter president / web site contact (current)

*Secretary / president elect (new position)

-Annual Mini-Conference involvement

*Presentations / Tours / Topics

-Student Chapter involvement

*Brian Finder, Risk Control Center, UW-Stout

*SESHA papers (topics, problems, projects, programs, and training)

*Field projects

-Vendor Night

*Work with ASSE, AIHA

-Web site enhancement

*Use SESHA logo

*Enhance Twin Cities Chapter title

*Digital photo of members

*Digital photo of Genesis award

*Use links to access old minutes

Mike Sherman, FSI Product Safety, led discussion on following topics:
-Ventilation Maximization (open & closed systems)

-Fire Codes – discussed Tom Wang SESHA presentation

-Arsine: lowering of TLV; how to measure; SESHA article by Margaret O’Brien

-Heated chemical studies – guidelines / industry stds are over 8trs old

-Ergonomics – checklist for equipment; Semi-S8

-Tracer gas studies – how to measure spill evaporation (open & closed systems)

-Risk Assessment methodologies – quantifying probability; Semi-S10

For more information on the SESHA Twin Cities Chapter meetings contact:

Heartland Region Director:

David Bartko - Aon Risk Services, 952-656-8183,

Twin Cities Chapter President:

Pat Gruneberg – Cypress Semiconductor, 612-851-5018,

University of Wisconsin-Stout

Menomonie, Wisconsin 54751-0790

June 15, 2000

Mr. David Bartko

Aon Risk Services
8300 Norman Center Drive

Bloomington, MN 55437

Hello David,

Thank you for allowing me the opportunity to attend the SESHA Twin Cities Chapter meeting on June 13, 2000. To reiterate what I presented during the meeting, UW-Stout strongly desires to work with upper mid-western semiconductor firms for the purpose of identifying risk control (e.g., safety/health/ environmental/financial)-based field projects for our graduate students. Such projects not only permit these future business and industry leaders to apply managerial and technical skills that our M.S. in Risk Control program stresses, but also serve as the basis of research papers which may lead to scholarships through the SESHA. Generally, the types of field projects that we like for our students to tackle include:

Situations where significant loss (employee, equipment, product, facility, financial, or environmental,) has or is currently occurring, or
Situations where notable loss has yet to occur, but based on observed current practices/processes, it is intuitive that significant loss will sooner or later happen.
A typical field project requires the student to define the scope of a loss-related problem, perform a literature review of what has been done in the past, develop and carry out a process analysis (experimental, survey, observations, etc.) that identifies specific uncontrolled risk factors, and provide reasonable technical as well as managerial recommendations on how to control the loss exposure. For the most part, we prefer that the field projects avoid having to perform employee training or miscellaneous record-keeping-related activities, but rather, involve somewhat higher-level functions that facility/corporate risk managers typically perform on a daily basis.

As time permits, please consider spreading the word to your various semiconductor-related contacts of this opportunity that our faculty would be pleased to facilitate. If they can think of some potential topics which may serve as field projects and/or SESHA scholarship papers for next year's conference, I'd be happy to bring interested students to your next chapter meeting in early September for further discussion. Please contact me at (715)232-1422 if you have any questions regarding this matter.


Brian J. Finder, DIT, CIH

Assistant Professor

Risk Control Center

125 Science Wing